ESREF 2009, the 20th European Symposium on Reliability of Electron Devices will take place at Bordeaux (France) from 5th to 9th October 2009.
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
The scope of EOBT, Electron and Optical Beam Test Conference is included in the ESREF Conference.
This event is organised by the IMS Laboratory (UMR CNRS 5218, University Bordeaux 1, ENSEIRB, ENSCPB ) and ADERA with the technical co-sponsorship of IEEE - Electron Devices Society, IEEE - Reliability Society and ANADEF association (French association of industrial labs working in failure analysis)
For further information, please contact :
Université Bordeaux 1 - Laboratoire IMS
351 cours de la Libération - 33405 TALENCE CEDEX - FRANCE
Phone: 33 (0)5 40 00 65 51- Fax : 33 (0)5 56 37 15 45